Research Preview

Standardized spin defect
characterization — off the shelf

Concept visualization of the AnalysePlatform — compact benchtop spin defect characterization system Concept visualization — not final product
Benchtop No optical table required
Enclosed Integrated laser safety
Turnkey Sample in, report out
All-in-one MW source & RF electronics included

A compact, laser-safe system for reproducible characterization of color centers in diamond and SiC. From confocal scan to standardized qubit and quantum sensor characterization — with comparable, export-ready reports.

Help Shape the Product 3-minute survey — your input defines what we build

The problem

Spin defect characterization today is manual, fragmented, and person-dependent. There is no off-the-shelf system for it.

Person-dependent results

Analysis relies on custom scripts written by individuals. When they leave, the knowledge leaves with them.

No standardized workflow

Every lab builds its own pipeline from scratch — confocal setup, measurement scripts, analysis code, reporting. Nothing is reusable.

Reproducibility is hard to prove

Results vary between people, setups, and time. Comparing measurements across samples, batches, or labs requires manual effort.

No dedicated QC tool exists

Startups manufacturing diamond or SiC substrates must characterize every batch — but there is no commercial system built for this.

What we're building

A dedicated, all-in-one characterization system — including microwave source, RF electronics, and laser. Not a replacement for your confocal, but the missing piece between raw measurements and comparable results.

Confocal scan & localization

Find and identify color centers with integrated confocal optics.

Standardized measurements

Run ODMR, Rabi, Ramsey, and more with pre-defined, reproducible sequences.

Automated analysis

Fits, parameter extraction, and quality checks — no custom scripts needed.

Comparable reports & metrics

Standardized output you can compare across samples, people, and time. Export-ready.

Diamond — NV centers
SiC — VSi, divacancy

Who this is for

Whether you're characterizing samples for research or for production quality control — the pain is the same.

Research labs Complement your confocal with standardized analysis and reporting
Quantum startups Characterize every device or batch — on-site, reproducibly, without external services
Diamond & SiC manufacturers Quality control for quantum-grade substrates at production scale

Built by the people who live the problem

We're a spinoff from the 3rd Institute of Physics at the University of Stuttgart, home to one of the world's leading groups in diamond spin physics under Prof. Dr. Jörg Wrachtrup.

We've spent years running exactly the characterization workflows we're now building a product around. We know the late nights fitting ODMR spectra with fragile scripts. We know what it's like when a colleague leaves and their analysis pipeline leaves with them. We know the pain — because it's our pain too.

Our vision is simple: every lab that works with spin defects should have a standardized characterization tool on the bench — the same way every chemistry lab has a spectrometer. Not a pile of custom scripts, but a proper instrument.

Shape what we build

We're designing the first version right now. If you participate early, your needs directly influence the specs. This is your chance to get the tool you actually want — not what we think you need.

Take the Survey
Idea IDEA
YOU

Help us build the right thing

This is an early-stage survey to gauge general interest — no commitment, no sign-up. We're learning how labs and companies characterize spin defects today. Your input directly shapes what we build.

The product your input shapes THE PRODUCT